| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a light measuring device capable of performing spectroscopic measurement with high accuracy. <P>SOLUTION: A spectrometer 1 comprises an etalon for short-wavelength region 2A that extracts first wavelength light in a first measurement wavelength region, an etalon for long-wavelength region 2B that extracts second wavelength light in a second measurement wavelength region, a wavelength of which is longer than a wavelength of the first measurement wavelength region, an aperture for short-wavelength region 4A that adjusts the amount of light to be measured that is incident on the etalon for short-wavelength region 2A, an aperture for long-wavelength region 4B that adjusts the amount of the light to be measured that is incident on the etalon for long-wavelength region 2B, a photodetector for short-wavelength region 3A that receives the first wavelength light and outputs a detection signal, and a photodetector for long-wavelength region 3B that receives the second wavelength light and outputs a detection signal. The amount of the light passing through the aperture for short-wavelength region 4A is larger than the amount of the light passing through the aperture for long-wavelength region 4B. <P>COPYRIGHT: (C)2012,JPO&INPIT |
