发明名称 INSPECTION DEVICE FOR LUMINESCENCE PANEL AND INSPECTION METHOD FOR LUMINESCENCE PANEL
摘要 <P>PROBLEM TO BE SOLVED: To provide an inspection device for a luminescence panel capable of inexpensively inspecting a luminescent state of a luminescence panel with a simple configuration, and to provide an inspection method for a luminescence panel. <P>SOLUTION: The inspection device 20 for a luminescence panel includes a luminescence signal generating unit 21, an inspection unit 22 and a comparing unit 23. The luminescence signal generating unit 21 is connected to a connecting unit of a luminescence panel as an inspection object, for example, an organic EL (electroluminescence) device (luminescence panel) and transmits a luminescence signal to allow any pixel in the organic El device to emit light. The comparing unit 23 directly receives luminescent light of each pixel, compares the light quantity to a preliminarily determined reference light quantity of luminescence of each pixel, and detects luminescence failure in each pixel. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011232276(A) 申请公布日期 2011.11.17
申请号 JP20100104909 申请日期 2010.04.30
申请人 SEIKO EPSON CORP 发明人 ATSUMI MASASHI
分类号 G01M11/00 主分类号 G01M11/00
代理机构 代理人
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