发明名称 TEST APPARATUS AND TEST METHOD
摘要 There is provided a test apparatus for testing a device under test, including a test signal generator that generates a test signal to test the device under test, an electric-photo converter that converts the test signal into an optical test signal, an optical interface that (i) transmits the optical test signal generated by the electric-photo converter to an optical receiver of the device under test and (ii) receives and outputs an optical response signal output from the device under test, a photo-electric converter that converts the optical response signal output from the optical interface into an electrical response signal and transmits the electrical response signal, and a signal receiver that receives the response signal transmitted from the photo-electric converter and a test method.
申请公布号 US2011279109(A1) 申请公布日期 2011.11.17
申请号 US201113038344 申请日期 2011.03.01
申请人 MASUDA SHIN;ADVANTEST CORPORATION 发明人 MASUDA SHIN
分类号 G01R31/00 主分类号 G01R31/00
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