发明名称 METHOD FOR MANUFACTURING SOI WAFER
摘要 A method for manufacturing an SOI wafer including implanting a gas ion into a bond wafer from a surface thereof to form an ion-implanted layer; bonding the ion-implanted surface of the bond wafer to a surface of a base wafer through an insulator film; and delaminating the bond wafer at the ion-implanted layer to manufacture the SOI wafer. The method further includes immersing the bonded wafer prior to the delamination of the bond wafer at the ion-implanted layer into a liquid capable of dissolving the insulator film or exposing the bonded wafer to a gas capable of dissolving the insulator film so that the insulator film located between the bond wafer and the base wafer is etched from an outer circumferential edge toward a center of the bonded wafer.
申请公布号 US2011281420(A1) 申请公布日期 2011.11.17
申请号 US201013145275 申请日期 2010.01.08
申请人 AGA HIROJI;YOKOKAWA ISAO;NOTO NOBUHIKO;SHIN-ETSU HANDOTAI CO., LTD. 发明人 AGA HIROJI;YOKOKAWA ISAO;NOTO NOBUHIKO
分类号 H01L21/301 主分类号 H01L21/301
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