发明名称 SPECTRAL REFLECTIVITY MEASURING DEVICE AND SPECTRAL REFLECTIVITY MEASURING METHOD
摘要 <p>Disclosed is a spectral reflectivity measuring device (1) provided with a reflection calibration plate (4), a plurality of optical filters (5) for transmitting light with different wavelengths therethrough, an image capturing unit (6), and a calculation processing unit (7). A plurality of images of an object to be measured (3) and the reflection calibration plate (4) are acquired while changing the optical filters (5). In the reflection calibration plate (4), a plurality of reflection calibration sections (4a) having different spectral reflectivities are formed, and the spectral reflectivities of the respective reflection calibration sections (4a) are known. In the calculation processing unit (7), the plurality of images of the object to be measured (3) and the reflection calibration plate (4), which are captured via the respective optical filters (5), are processed, and the spectral reflectivity of the object to be measured (3) is derived by a predetermined calculation.</p>
申请公布号 WO2011142295(A1) 申请公布日期 2011.11.17
申请号 WO2011JP60575 申请日期 2011.05.06
申请人 OHTA NAOYA;NATIONAL UNIVERSITY CORPORATION GUNMA UNIVERSITY 发明人 OHTA NAOYA
分类号 G01N21/27;G01J3/28 主分类号 G01N21/27
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