发明名称 NON-VOLATILE MEMORY DEVICE AND OPERATION METHOD OF THE SAME
摘要 PURPOSE: A non-volatile memory device and a method thereof are provided to increase the reliability of the non-volatile memory device by processing a block over the number of an erase operation as a bad block. CONSTITUTION: In a non-volatile memory device and a method thereof, erase sensors(111,121) are arranged at memory blocks(110,120). The erase sensors generate a detection signal. The detection signal is activated whenever an erase operation of a corresponding memory block is performed. If the number of activation of the detection signal is over a reference value, a controller(130) processes the corresponding memory block as a bad block. The erase sensor uses the voltage level of a word line in the memory block and the voltage level applied to the well area.
申请公布号 KR101083642(B1) 申请公布日期 2011.11.16
申请号 KR20100065302 申请日期 2010.07.07
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, NAM KYEONG;CHOI, JUNG MIN
分类号 G11C16/16;G11C16/14;G11C16/34 主分类号 G11C16/16
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