发明名称 |
NON-VOLATILE MEMORY DEVICE AND OPERATION METHOD OF THE SAME |
摘要 |
PURPOSE: A non-volatile memory device and a method thereof are provided to increase the reliability of the non-volatile memory device by processing a block over the number of an erase operation as a bad block. CONSTITUTION: In a non-volatile memory device and a method thereof, erase sensors(111,121) are arranged at memory blocks(110,120). The erase sensors generate a detection signal. The detection signal is activated whenever an erase operation of a corresponding memory block is performed. If the number of activation of the detection signal is over a reference value, a controller(130) processes the corresponding memory block as a bad block. The erase sensor uses the voltage level of a word line in the memory block and the voltage level applied to the well area.
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申请公布号 |
KR101083642(B1) |
申请公布日期 |
2011.11.16 |
申请号 |
KR20100065302 |
申请日期 |
2010.07.07 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, NAM KYEONG;CHOI, JUNG MIN |
分类号 |
G11C16/16;G11C16/14;G11C16/34 |
主分类号 |
G11C16/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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