发明名称 Current sensor for a semiconductor device and system
摘要 <p>A current sensor which can be used to measure current flowing through a semiconductor substrate of a direct current (DC) to DC converter or other device. The current sensor can provide continuous measurements during operation of the DC to DC converter. In one embodiment, a first current sensor (21) can be use to measure current flow through a high side transistor (12) and a second current sensor (35) can be used to measure current flow through a low side transistor (14). In another embodiment, a single current sensor can be used to measure current flow through a semiconductor substrate whether the high side transistor is on or off, the low side transistor is on or off, or during switching of either the high side transistor or low side transistor.</p>
申请公布号 EP2387075(A2) 申请公布日期 2011.11.16
申请号 EP20100197288 申请日期 2010.12.29
申请人 INTERSIL AMERICAS INC. 发明人 GIRDHAR, DEV ALOK;HEBERT, FRANCOIS
分类号 H01L27/088;H03K17/08 主分类号 H01L27/088
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