发明名称 SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME
摘要 <p>PURPOSE: A semiconductor apparatus and a manufacturing method thereof are provided to include a gate insulating layer including a thermal oxide film which directly touches a silicon channel, thereby improving HCI(Hot Carrier Injection) properties. CONSTITUTION: A substrate(110) comprises a first region and second region respectively including an n-type region and p-type region. The n-type region of the first region includes a silicon channel(116). A silicon-germanium channel(116SG) is included in the p-type region of the first region. Each of the n-type and p-type regions of the second region includes the silicon channel. A first gate insulating film pattern(118a) which is a thermal oxide film is arranged on the substrate surface of the second region.</p>
申请公布号 KR20110123544(A) 申请公布日期 2011.11.15
申请号 KR20100043074 申请日期 2010.05.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JONG HO;OH, CHANG BONG;LEE, HO;KIM, MYUNG SUN
分类号 H01L21/336;H01L21/316;H01L29/78 主分类号 H01L21/336
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