发明名称 |
SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME |
摘要 |
<p>PURPOSE: A semiconductor apparatus and a manufacturing method thereof are provided to include a gate insulating layer including a thermal oxide film which directly touches a silicon channel, thereby improving HCI(Hot Carrier Injection) properties. CONSTITUTION: A substrate(110) comprises a first region and second region respectively including an n-type region and p-type region. The n-type region of the first region includes a silicon channel(116). A silicon-germanium channel(116SG) is included in the p-type region of the first region. Each of the n-type and p-type regions of the second region includes the silicon channel. A first gate insulating film pattern(118a) which is a thermal oxide film is arranged on the substrate surface of the second region.</p> |
申请公布号 |
KR20110123544(A) |
申请公布日期 |
2011.11.15 |
申请号 |
KR20100043074 |
申请日期 |
2010.05.07 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, JONG HO;OH, CHANG BONG;LEE, HO;KIM, MYUNG SUN |
分类号 |
H01L21/336;H01L21/316;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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