发明名称 |
Method of fabricating semiconductor device having metal-semiconductor compound regions |
摘要 |
Example embodiments relate to methods of fabricating a semiconductor device having a metal-semiconductor compound region. A method according to example embodiments may include forming semiconductor pillars on a semiconductor substrate. The semiconductor substrate between the semiconductor pillars may be etched to form a trench region. A dielectric isolation pattern partially filling the trench region may be formed, and dielectric sidewall spacers may be formed on sidewalls of the semiconductor pillars. Metal-semiconductor compound regions may be formed on sidewalls of a portion of the trench region that is not filled by the isolation pattern. |
申请公布号 |
US8058168(B2) |
申请公布日期 |
2011.11.15 |
申请号 |
US20100656885 |
申请日期 |
2010.02.18 |
申请人 |
PARK JONG-CHUL;KANG YUN-SEUNG;SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK JONG-CHUL;KANG YUN-SEUNG |
分类号 |
H01L21/44 |
主分类号 |
H01L21/44 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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