发明名称 Method of fabricating semiconductor device having metal-semiconductor compound regions
摘要 Example embodiments relate to methods of fabricating a semiconductor device having a metal-semiconductor compound region. A method according to example embodiments may include forming semiconductor pillars on a semiconductor substrate. The semiconductor substrate between the semiconductor pillars may be etched to form a trench region. A dielectric isolation pattern partially filling the trench region may be formed, and dielectric sidewall spacers may be formed on sidewalls of the semiconductor pillars. Metal-semiconductor compound regions may be formed on sidewalls of a portion of the trench region that is not filled by the isolation pattern.
申请公布号 US8058168(B2) 申请公布日期 2011.11.15
申请号 US20100656885 申请日期 2010.02.18
申请人 PARK JONG-CHUL;KANG YUN-SEUNG;SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK JONG-CHUL;KANG YUN-SEUNG
分类号 H01L21/44 主分类号 H01L21/44
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