发明名称 Semiconductor device having a multilayered interconnection structure
摘要 A semiconductor device according to one embodiment includes: a semiconductor substrate provided with a semiconductor element; a first conductive member formed on the semiconductor substrate; a first insulating film formed on the same layer as the first conductive member; a second conductive member formed so as to contact with a portion of an upper surface of the first conductive member, a second insulating film formed on the first insulating film so as to contact with a portion of the upper surface of the first conductive member, and including at least one type of element among elements contained in the first insulating film except Si; and an etching stopper film formed on the second insulating film so as to contact with a portion of a side surface of the second conductive member, and having an upper edge located below the upper surface of the second conductive member.
申请公布号 US8058730(B2) 申请公布日期 2011.11.15
申请号 US20080239236 申请日期 2008.09.26
申请人 WADA MAKOTO;HIGASHI KAZUYUKI;KABUSHIKI KAISHA TOSHIBA 发明人 WADA MAKOTO;HIGASHI KAZUYUKI
分类号 H01L29/06 主分类号 H01L29/06
代理机构 代理人
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