发明名称 |
Device and a method for estimating transistor parameter variations |
摘要 |
A method and a device for estimating parameter variations of transistors that belong to the same circuit. The method includes: providing the first circuit; providing a test circuit adapted to perform a first function and a stacked test circuit adapted to perform a second function that substantially equals the first function; wherein the test circuit, the stacked test circuit and the first circuit are processed under substantially the same processing conditions; determining a relationship between a parameter of the test circuit and a parameter of the stacked test circuit; and estimating parameter variations of transistors that belong to the first circuit in response to the determined relationship. |
申请公布号 |
US8060324(B2) |
申请公布日期 |
2011.11.15 |
申请号 |
US20060162179 |
申请日期 |
2006.02.01 |
申请人 |
PRIEL MICHAEL;KUZMIN DAN;ROZEN ANTON;FREESCALE SEMICONDUCTOR, INC. |
发明人 |
PRIEL MICHAEL;KUZMIN DAN;ROZEN ANTON |
分类号 |
G01R11/073;G01R11/20;G01R19/165;G06F11/07 |
主分类号 |
G01R11/073 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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