发明名称 |
THE COMPLICATED TYPE NONDESTRUCTIVE INSPECTION APPARATUS USING THE HYBRID MAGNETIC INDUCTION THIN FILM SENSOR |
摘要 |
PURPOSE: A complex non-destructive inspecting device using a hybrid induced magnetic film sensor is provided to quantitively inspect the size of defects in a target and detect defects regardless of the material of a target and the position of a defective part. CONSTITUTION: A complex non-destructive inspecting device using a hybrid induced magnetic film sensor comprises a signal generator(11), an AC power applying unit(12), a signal detecting unit(10), a filtering and amplifying unit(13), a data collecting unit(14), and a signal receiving computer(15). The signal generator supplies frequency to apply magnetic field(4) to an exited coil(3), which is inserted into the hybrid induced magnetic film sensor. The AC power applying unit comprises a power supply unit. The power supply unit supplies appropriate frequency of AC power to the signal generator.
|
申请公布号 |
KR20110122964(A) |
申请公布日期 |
2011.11.14 |
申请号 |
KR20100042342 |
申请日期 |
2010.05.06 |
申请人 |
NOVA MAGNETICS;INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YEUNGNAM UNIVERSITY |
发明人 |
KIM, JONG HO;NA, YONG BAE;SHIN, DONG MOON;KIM, KI HYEON |
分类号 |
G01N27/82;G01N27/72 |
主分类号 |
G01N27/82 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|