发明名称 REPAIR METHOD AND REPAIR SYSTEM FOR HALF TONE MASK
摘要 <P>PROBLEM TO BE SOLVED: To provide a repair method and system that removes a defect of a half tone mask by using a laser, can efficiently form a block film in a defect area, adjusts a film thickness of the block film, enables the defect to be removed even after a pellicle film is formed, adjusts permeability in real time so as to carry out a repair process, and guarantees the uniformity of the permeability of a repaired section. <P>SOLUTION: In a repair method for a half tone mask, a defect section in a semi-transparent area of the half tone mask is repaired by irradiating a source material with a laser to evaporate it onto the defect section of a semi-transparent layer. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011227209(A) 申请公布日期 2011.11.10
申请号 JP20100095475 申请日期 2010.04.16
申请人 COWIN DST CO LTD 发明人 YONG-KAB CHONG;KIM LL HO
分类号 C23C14/24;G03F1/72 主分类号 C23C14/24
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