| 摘要 |
<p>A malfunction analysis apparatus (100) is provided with a malfunction-analysis processing unit (107), an attribute-extraction processing unit (108), and an output unit (105). The malfunction-analysis processing unit (107) obtains a malfunction-contribution degree, which indicates the degree that individual malfunctions (to be called malfunctioning elements, hereafter) contributed to the malfunctioning of the object being analyzed, on the basis of the relative relationship between the data to be analyzed that has, as elements thereof, values generated on the basis of a plurality of indicator values of the object being analyzed, and representative values for the plurality of indicators corresponding to each of the plurality of malfunctions. Then, the malfunctioning-analysis processing unit (107) specifies the malfunctioning elements being generated, on the basis of the obtained malfunction-contribution degree. The attribute-extraction processing unit (108) specifies, when a malfunctioning is taking place that is a combination of the malfunctioning elements, the indicators that are estimated as the cause of the specified malfunctioning elements, on the basis of the representative values that the plurality of indicators take, and the values of each of the elements of the data to be analyzed that was stored. The output unit (105) outputs the specified malfunctioning elements and/or the indicators.</p> |
