发明名称 ABNORMALITY DETECTION AND DIAGNOSIS METHOD, ABNORMALITY DETECTION AND DIAGNOSIS SYSTEM, AND ABNORMALITY DETECTION AND DIAGNOSIS PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To provide an abnormality detection and diagnosis method and system that can detect an abnormality at an early stage and with high sensitivity in a facility such as a plant. <P>SOLUTION: Maintenance history information composed of past events such as work history and part replacement information is associated with each other on a keyword basis. An abnormality is detected based on abnormality detection targeting an output signal of a multidimensional sensor installed in a facility, and the detected abnormality is connected to associated maintenance history information, whereby a diagnosis and measures necessary for the occurred abnormality are determined. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011227706(A) 申请公布日期 2011.11.10
申请号 JP20100096873 申请日期 2010.04.20
申请人 HITACHI LTD 发明人 MAEDA SHUNJI;SHIBUYA HISAE;MAGARA HIROYUKI
分类号 G05B23/02;F01D25/00;F02C7/00;F02C9/00;G01M99/00;G06Q50/00;G06Q50/10 主分类号 G05B23/02
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