发明名称 |
ABNORMALITY DETECTION AND DIAGNOSIS METHOD, ABNORMALITY DETECTION AND DIAGNOSIS SYSTEM, AND ABNORMALITY DETECTION AND DIAGNOSIS PROGRAM |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an abnormality detection and diagnosis method and system that can detect an abnormality at an early stage and with high sensitivity in a facility such as a plant. <P>SOLUTION: Maintenance history information composed of past events such as work history and part replacement information is associated with each other on a keyword basis. An abnormality is detected based on abnormality detection targeting an output signal of a multidimensional sensor installed in a facility, and the detected abnormality is connected to associated maintenance history information, whereby a diagnosis and measures necessary for the occurred abnormality are determined. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2011227706(A) |
申请公布日期 |
2011.11.10 |
申请号 |
JP20100096873 |
申请日期 |
2010.04.20 |
申请人 |
HITACHI LTD |
发明人 |
MAEDA SHUNJI;SHIBUYA HISAE;MAGARA HIROYUKI |
分类号 |
G05B23/02;F01D25/00;F02C7/00;F02C9/00;G01M99/00;G06Q50/00;G06Q50/10 |
主分类号 |
G05B23/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|