发明名称 BONDING STRESS TESTING ARRANGEMENT AND METHOD OF DETERMINING STRESS
摘要 A bonding stress testing arrangement and a method of determining stress are provided. The bonding stress testing arrangement includes at least one bond pad; a sensor assembly comprising any one of a first sensor arrangement, a second sensor arrangement and a combination of the first sensor arrangement and the second sensor arrangement; wherein the first sensor arrangement is adapted to measure an average stress on a portion of a bonding area under the at least one bond pad, and the second sensor arrangement is adapted to determine stress distribution over a portion or an entire of the bonding area under the at least one bond pad.
申请公布号 WO2011139231(A1) 申请公布日期 2011.11.10
申请号 WO2011SG00168 申请日期 2011.05.03
申请人 AGENCY FOR SCIENCE, TECHNOLOGY AND RESEARCH;SELVANAYAGAM, CHERYL SHARMANI;ZHANG, XIAOWU;CHAI, TAI CHONG;TRIGG, ALASTAIR DAVID;CHENG, CHENG KUO;CHEN, XIAN TONG;VAIDYANATHAN, KRIPESH 发明人 SELVANAYAGAM, CHERYL SHARMANI;ZHANG, XIAOWU;CHAI, TAI CHONG;TRIGG, ALASTAIR DAVID;CHENG, CHENG KUO;CHEN, XIAN TONG;VAIDYANATHAN, KRIPESH
分类号 G01L1/18;H01L21/66 主分类号 G01L1/18
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