发明名称 |
DETERMINATION OF MATERIAL OPTICAL PROPERTIES FOR OPTICAL METROLOGY OF STRUCTURES |
摘要 |
Methods of determining a material optical property for optical metrology of a structure is described. One method includes simulating a set of diffraction orders for a grating structure based on two or more azimuth angles and on one or more angles of incidence. A simulated spectrum is provided based on the set of diffraction orders. Another method includes simulating a set of diffraction orders for a grating structure based on two or more angles of incidence. A simulated spectrum is provided based on the set of diffraction orders.
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申请公布号 |
US2011276319(A1) |
申请公布日期 |
2011.11.10 |
申请号 |
US20100775392 |
申请日期 |
2010.05.06 |
申请人 |
MADSEN JONATHAN MICHAEL;YANG WEIDONG |
发明人 |
MADSEN JONATHAN MICHAEL;YANG WEIDONG |
分类号 |
G06G7/62 |
主分类号 |
G06G7/62 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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