发明名称 |
DEVICE AND METHOD FOR INSPECTING MOVING SEMICONDUCTOR WAFERS |
摘要 |
<p>Device for inspecting defects in semiconductor wafers, comprising a member for detecting surface defects using variations in the slope of a surface of the wafer, a member for detecting surface defects using variations in the light intensity reflected by a surface of the wafer, at a plurality of points, a member for detecting light intensity scattered by the surface of the wafer, a light source, and a detecting and classifying mechanism connected upstream of said detecting members.</p> |
申请公布号 |
WO2011138524(A1) |
申请公布日期 |
2011.11.10 |
申请号 |
WO2011FR00273 |
申请日期 |
2011.05.04 |
申请人 |
ALTATECH SEMICONDUCTOR;GASTALDO, PHILIPPE;PERNOT, FREDERIC;PIFFARD, OLIVIER |
发明人 |
GASTALDO, PHILIPPE;PERNOT, FREDERIC;PIFFARD, OLIVIER |
分类号 |
H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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