发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method permitting prevention of wire sweep and wire short circuiting caused by an injected resin. <P>SOLUTION: By a semiconductor device manufacturing method, a semiconductor chip 109 is mounted on a wiring board 100, the wiring board 100 and the semiconductor chip 109 are connected by stretching a first wire group 120 and a second wire group 118 less in wire length than the first wire group, and a sealing body 401 covering the semiconductor chip 109, the first wire group 120 and the second wire group 118 is formed by injecting a sealing resin 307 from the first wire group 120 toward the second wire group 118. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011228603(A) 申请公布日期 2011.11.10
申请号 JP20100099436 申请日期 2010.04.23
申请人 ELPIDA MEMORY INC 发明人 HANDA NAOHIRO
分类号 H01L23/29;H01L21/56;H01L21/60;H01L23/31 主分类号 H01L23/29
代理机构 代理人
主权项
地址