发明名称 TRANSMISSION ELECTRON MICROSCOPY GRID
摘要 <P>PROBLEM TO BE SOLVED: To provide a transmission electron microscopy grid. <P>SOLUTION: The transmission electron microscopy grid includes a carrier, a carbon nano-tube support, and a fixing body. The carrier has at least one first through hole, and the fixing body has at least one second through hole. The first through hole and the second through hole are arranged to face each other, the carbon nano-tube support is provided between the carrier and the fixing body, and located between the first through hole and second through hole. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011228284(A) 申请公布日期 2011.11.10
申请号 JP20110067647 申请日期 2011.03.25
申请人 BEIJING FUNATE INNOVATION TECHNOLOGY CO LTD 发明人 FENG CHEN;HAN LI;LIU LIANG;QIAN LI;WANG YOU QUAN
分类号 H01J37/20;C01B31/02 主分类号 H01J37/20
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