发明名称 METHOD FOR ALIGNING SPOT LIGHT POSITION OF OPTICAL DISPLACEMENT DETECTION MECHANISM AND SCANNING PROBE MICROSCOPE USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for aligning a spot light position of an optical displacement detection mechanism enabling easy and secure alignment of the light from a source with an object to be measured or a light receiving surface of a photodetector. <P>SOLUTION: In an optical displacement detection mechanism comprising a light source 10 for irradiating a cantilever 6 as a measuring object, a light source driving circuit 21 for driving the light source 10, a photodetector 16 for detecting light intensity by receiving the light after irradiation of the cantilever 6 from the light source 10, and an amplifier 22 for amplifying a detected signal by the photodetector 16 with a predetermined gain, the detection sensibility of the photodetector 16 is set lower than the sensibility for actually measuring a target object using a gain (amplification factor) controller so as to align a light spot 20 with a predetermined position of the photodetector 16 using an alignment mechanism 18 for the photodetector. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011227097(A) 申请公布日期 2011.11.10
申请号 JP20110170479 申请日期 2011.08.03
申请人 SII NANOTECHNOLOGY INC 发明人 IYOGI MASATO
分类号 G01Q20/02;G01B11/00;G01Q60/24 主分类号 G01Q20/02
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