| 摘要 |
An improved method of testing and sorting electronic devices (34,36) uses two or more test stations (38,40) and two or more sorting stations (42,44) applied to a single track (14) to improve system throughput. Applying two or more test stations (38,40) and two or more sorting stations (42,44) to a single track (14) accomplishes improved system throughput while increasing system cost less than would be expected if a duplicate track was installed for each test station (38,40). |
