发明名称 RESISTANCE MEASUREMENT METHOD FOR CONDUCTIVE SHEET, APPARATUS USED FOR THE SAME, AND MANUFACTURING METHOD OF CONDUCTIVE SHEET USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of accurately and swiftly measuring a resistance of a conductive sheet having on the surface thereof a conductive layer exposure region which includes multiple island-shaped exposure portions where the conductive layer is exposed in an island shape. <P>SOLUTION: A resistance measurement method is provided for a conductive layer of a conductive sheet 20 composed of the conductive layer and a resin layer formed on the surface of the conductive layer. The conductive sheet 20 has a conductive layer exposure region including multiple island-shaped exposure portions in each of which the conductive layer is exposed in an island shape on the surface of the resin layer. A pair of short-cylindrical probes 30 in each of which a strip electrode is formed on the circumferential surface of a short-cylindrical component continuously over the whole circumference, are used as probes for resistance measurement. The method comprises a step of scanning while bringing strip electrodes 25 of the pair of short-cylindrical probes 30 into pressure contact simultaneously on two points of the conductive layer exposure region spaced from each other. Moreover, a maximum height roughness Rz (JIS B0601:2001) of the surface of the strip electrodes 25 is within a range of 80-200% by taking the maximum height roughness Rz (JIS B0601:2001) of the surface of a conductive layer exposure region 13' as a reference. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011226903(A) 申请公布日期 2011.11.10
申请号 JP20100096661 申请日期 2010.04.20
申请人 BRIDGESTONE CORP 发明人 AOKI SHIGERU
分类号 G01R27/02;H01B13/00 主分类号 G01R27/02
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