发明名称 METHOD FOR DETECTION OF LOCAL DEFECTS IN SOLAR BATTERY PLATES
摘要 The invention relates to means for semiconductor technique for analyses of solar battery plates. A method for local defects detection in solar plates comprises: formation of environment as a transparent layer between the transparent plate and surface of a semiconductor plate, connection of the semiconductor plate to electric power supply, electrical potentials on semiconductor plate surface is detected using visual image of arias in environment. An environment from transparent liquid located between a transparent glass plate and the solar battery plate is formed; the power supply is connected to semiconductor plate pn-junction, reverse voltage of pn-junction is slowly increased. Defects are detected visually in points of flattened-out gas bubbles occurrence (throughout the transparent liquid layer). The bubbles occur as a result of electrolyses of transparent liquid caused by an electric potential in arias of local defects on solar battery plate surface. Upon disconnection of power supply, an image of gas bubbles is fixed, which are located above area of defect occurrence in thin layer of transparent liquid. The invention allows defects detecting, which are not detected by thermographic printing method.
申请公布号 UA96545(C2) 申请公布日期 2011.11.10
申请号 UA20100015505 申请日期 2010.12.22
申请人 POPOV VOLODYMYR MYKHAIALOVYCH;KLYMENKO ANATOLII SEMENOVYCH;POKANEVYCH OLEKSII PLATONOVYCH;PANIN ANATOLII IVANOVYCH 发明人 POPOV VOLODYMYR MYKHAIALOVYCH;KLYMENKO ANATOLII SEMENOVYCH;POKANEVYCH OLEKSII PLATONOVYCH;PANIN ANATOLII IVANOVYCH
分类号 H01L29/34;G01N21/88;G01N27/61 主分类号 H01L29/34
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