发明名称 ION IMPLANTATION CONDITION SETTING METHOD, PROCESS DEVICE SIMULATOR, STORAGE MEDIUM AND PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To easily set an ion implantation condition by evaluating energy in desired range projection or bonding depth by LSS theory. <P>SOLUTION: An ion implantation condition setting method for setting an ion implantation condition for simulating an ion implantation distribution by a computer is realized by performing a parameter selection procedure for permitting a user to select a desired distribution parameter Y related to the ion implantation distribution, a value setting procedure for permitting the user to set a value of the desired distribution parameter Y and an ion implantation condition setting procedure for setting the ion implantation condition in accordance with a value of the desired distribution parameter Y by the computer. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011228506(A) 申请公布日期 2011.11.10
申请号 JP20100097343 申请日期 2010.04.20
申请人 FUJITSU LTD 发明人 SUZUKI KUNIHIRO
分类号 H01L21/265 主分类号 H01L21/265
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