发明名称 NONVOLATILE MEMORY DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a nonvolatile memory device that can reduces a thickness of a rectifier cell while maintaining a rectification property thereof. <P>SOLUTION: There is provided a nonvolatile memory device that includes: a memory unit having a negative electrode, a memory layer, and a positive electrode; and a rectifier cell connected to the negative electrode or the positive electrode, or internally embedded with the memory unit. The rectifier cell includes: a first semiconductor layer; a second semiconductor layer; and an insulation layer disposed between the first semiconductor layer and the second semiconductor layer. The first semiconductor layer and the second semiconductor layer are one of a p<SP POS="POST">+</SP>-type semiconductor and an n<SP POS="POST">+</SP>-type semiconductor. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011228522(A) 申请公布日期 2011.11.10
申请号 JP20100097775 申请日期 2010.04.21
申请人 TOSHIBA CORP 发明人 SONEHARA TAKASHI
分类号 H01L27/10;H01L27/105;H01L27/28;H01L29/88;H01L45/00;H01L49/00;H01L51/05 主分类号 H01L27/10
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