发明名称 |
MASK BLANK, TRANSFER MASK, METHODS FOR MANUFACTURING THE SAME, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a mask blank, a transfer mask and other components with excellent chemical resistance and excellent ArF irradiation resistance. <P>SOLUTION: A mask blank is used for manufacturing a transfer mask and comprises a light-shielding film 30 on a translucent substrate 1. The light-shielding film 30 is constituted of a material containing tantalum as a main metal component, and a high-oxidized layer 4 with an in-layer oxygen content of 60 at.% or more is formed in the surface layer on a side opposite to a translucent substrate side of the light-shielding film 30. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2011227461(A) |
申请公布日期 |
2011.11.10 |
申请号 |
JP20110037970 |
申请日期 |
2011.02.24 |
申请人 |
HOYA CORP |
发明人 |
NOZAWA JUN;SHISHIDO HIROAKI;SUZUKI TOSHIYUKI |
分类号 |
C23C14/06;C23C14/08;G03F1/50;G03F1/54 |
主分类号 |
C23C14/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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