ELECTRONIC COMPONENT HANDLING DEVICE, ELECTRONIC COMPONENT TESTING DEVICE, AND ELECTRONIC COMPONENT TESTING METHOD

摘要

PROBLEM TO BE SOLVED: To provide an electronic component handling device for testing an electronic component to be tested having input/output terminals provided on both sides.

SOLUTION: An electronic component handling device 10 for handling an electronic component to be tested 100 having a first principal surface provided with a first device terminal and a second principal surface provided with a second device terminal includes a contact arm 315 having a holding side contact arm 317 to which a first socket 319 is attached and a suction pad 317c that holds the electronic component to be tested 100, and an alignment device 320 for aligning the first socket 319 and the electronic component to be tested 100 and further aligning the electronic component to be tested 100 that is held by the suction pad 317c and are in contact with the first socket 319 with respect to a second socket 301. The contact arm 315 presses the second device terminal of the electronic component to be tested 100 against the second socket 301.

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