A CARRIER MODULE OF A HANDLER EQUIPMENT TO TEST A SEMICONDUCTOR ELEMENT

摘要

PURPOSE: A carrier module of a semiconductor device test handler is provided to minimize a semiconductor device which is misjudged as loss and fault during a transferring process. CONSTITUTION: A moving groove(41) and an axle groove(42) are formed in a latch(40). The axle groove is combined to an axial pin(44) in a body(10). The moving groove is connected to a pocket(20) by a fixed spindle(43). A supporting body(30) combined with the body ascends and descends. The latch for closely fixing a semiconductor device is rotated around an axis. The latch is rotated with the moving groove.