发明名称 |
METHODS OF CHEMICAL ANALYSIS AND APPARATUS FOR CHEMICAL ANALYSIS |
摘要 |
PURPOSE: Method and device for analyzing chemical components are provided to enable easy analysis on mass spectrum due to increase in emission of fragment ion and molecular ion. CONSTITUTION: A method for analyzing chemical components is as follows. Ionized gas is sprayed to a target(S). Ion beams collide with the target. The mass of fragment ion and molecular ion discharged from the target by the collision of the ion beam is analyzed. The ionized gas is sprayed in a molecule beam type. The ionized gas is mixed and sprayed with inert gas. The ionized gas is acid or basic. The ionized gas and steam are sprayed simultaneously or alternately.
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申请公布号 |
KR20110121999(A) |
申请公布日期 |
2011.11.09 |
申请号 |
KR20100041553 |
申请日期 |
2010.05.03 |
申请人 |
SAMSUNG ELECTRO-MECHANICS CO., LTD. |
发明人 |
PARK, SEONG CHAN |
分类号 |
G01N27/62;G01N27/64 |
主分类号 |
G01N27/62 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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