发明名称 Method of manufacturing semiconductor device
摘要 In a method of manufacturing a semiconductor device, a first groove and a second groove each having a width less than that of a scribe line are formed along the scribe line in a first protective film provided below a second protective film which protects element forming regions when a wafer is divided into parts by a laser dicing, and the first groove and the second groove are filled with the second protective film. Then, the laser dicing is performed on a region between the first groove and the second groove along the scribe line from the surface where the second protective film is formed to form a cutting groove that reaches at least a predetermined depth of the multi-layer interconnect.
申请公布号 US8053337(B2) 申请公布日期 2011.11.08
申请号 US20100659991 申请日期 2010.03.26
申请人 RENESAS ELECTRONICS CORPORATION 发明人 NODA TAKAMITSU
分类号 H01L21/78 主分类号 H01L21/78
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