发明名称 Substrate processing apparatus
摘要 When plasma processing is finished, a gate valve 13a is closed and cleaning gas is ejected from holes 121a of a shower plate 121, and at the same time, a microwave is generated from a microwave generator 101. Further, at this time, the inside of a process chamber 110 is exhausted through a second exhaust port 106. Since the exhaust is conducted through a second exhaust port 106 positioned lower than a wafer stage 104 in a lowered state when the inside of the process chamber 110 is cleaned, it is possible to more effectively remove gas and reaction products deposited especially in a lower portion of the process chamber 110.
申请公布号 US8052887(B2) 申请公布日期 2011.11.08
申请号 US20100689815 申请日期 2010.01.19
申请人 TOKYO ELECTRON LIMITED 发明人 NOZAWA TOSHIHISA;YUASA TAMAKI
分类号 C23C16/44;H01L21/205;C23C16/00;C23C16/511;H01J37/32 主分类号 C23C16/44
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