发明名称 MOM capacitors integrated with air-gaps
摘要 An integrated circuit structure combining air-gaps and metal-oxide-metal (MOM) capacitors is provided. The integrated circuit structure includes a semiconductor substrate; a first metallization layer over the semiconductor substrate; first metal features in the first metallization layer; a second metallization layer over the first metallization layer; second metal features in the second metallization layer, wherein the first and the second metal features are non-capacitor features; a MOM capacitor having an area in at least one of the first and the second metallization layers; and an air-gap in the first metallization layer and between the first metal features.
申请公布号 US8053865(B2) 申请公布日期 2011.11.08
申请号 US20080045547 申请日期 2008.03.10
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHANG CHUNG-LONG;YEH MING-SHIH;CHEN CHIA-YI;LU DAVID DING-CHUNG
分类号 H01L29/72 主分类号 H01L29/72
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