发明名称 Stacked gate nonvolatile semiconductor memory and method for manufacturing the same
摘要 A stacked gate nonvolatile semiconductor memory includes at least a memory cell transistor and a selective gate transistor which are formed on a semiconductor substrate. The memory cell transistor includes a floating gate made of a semiconductor material below an interlayer insulating layer and a control gate made of a silicide above the interlayer insulating layer. The selective gate transistor includes a semiconductor layer made of the semiconductor material, a silicide layer made of the silicide and a conductive layer made of a conductive material not subject to silicide process which is formed through the interlayer insulating film so as to electrically connect the semiconductor layer and the silicide layer.
申请公布号 US8053825(B2) 申请公布日期 2011.11.08
申请号 US20070927799 申请日期 2007.10.30
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 AOYAMA KENJI;NAGASHIMA SATOSHI
分类号 H01L29/788 主分类号 H01L29/788
代理机构 代理人
主权项
地址