发明名称 Methods of selective deposition of fine particles onto selected regions of a substrate
摘要 A method for depositing fine particles from a suspension on selected regions of a substrate is disclosed. The particles are deposited on selected regions of a clean hydrophobic semiconductor surface that are surrounded by a wetting boundary which includes a mesa formed by etching through a silicon-on-insulator (SOI) film and an underlying buried oxide of an SOI substrate. The process is well suited for the growth of semiconductor nanowires that nucleates from fine particle used as a catalyst.
申请公布号 US8053328(B2) 申请公布日期 2011.11.08
申请号 US20090352290 申请日期 2009.01.12
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 COHEN GUY MOSHE
分类号 H01L21/76 主分类号 H01L21/76
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