| 摘要 |
PURPOSE: The test method of a memory device and an integrated circuit is provided to reduce costs which are consumed in test and to shorten integrated circuit test time. CONSTITUTION: The signal waveform of a plurality of nodes is obtained through the motion simulation of an integrated circuit(S310). The information of a spot in which the signal logical value of a plurality of nodes is changed from the signal waveform of a plurality of nodes is sampled and a text file is created(S320). The text file is analyzed(S330).
|
