发明名称 APPARATUS, METHOD AND PROGRAM FOR FOCUS CORRECTION, AND MICROSCOPE
摘要 <P>PROBLEM TO BE SOLVED: To provide an apparatus, method and program for focus correction, and microscope which can stabilize the focus even when non-optical system elements generate a drift in different direction from the direction of a drift caused by optical system. <P>SOLUTION: The temperature is measured using temperature-sensitive element placed on one side, a plane for a preparation to be set as a reference, and then the temperature is measured using temperature-sensitive element placed on the other side, a plane for a preparation to be set as a reference. The displacement to the focus position is calculated based on the measured temperatures. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011221294(A) 申请公布日期 2011.11.04
申请号 JP20100090502 申请日期 2010.04.09
申请人 SONY CORP 发明人 YAMAMOTO TAKASHI
分类号 G02B7/28;G02B21/26;G02B21/36 主分类号 G02B7/28
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