| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a probe pin for an IC socket that is compatible with fine pitch arrangements while minimizing loss of reliability, durability, and contact reliability of conventional probe pins. <P>SOLUTION: A probe pin includes a plunger made of a thin metal sheet and a coil spring unit made of a metal wire which holds the plunger thereon. The plunger has first and second parts each having an upper contact strip, a wide-width portion, and a lower contact strip in an expanded state. The first and second parts are connected with each other via their respective wide-width portions. The plunger is folded along the boundary between the wide-width portions and integrally formed due to close contact at least between the wide-width portions. <P>COPYRIGHT: (C)2012,JPO&INPIT |
