发明名称 HEIGHT MEASURING METHOD AND APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To enable measuring the height of a photo spacer with accuracy regardless of its shape. <P>SOLUTION: For a luminance signal whose peak value indicating a focal point cannot be detected, i.e., a luminance signal whose maximum value is under a predetermined threshold value, a height measuring process is not performed and corresponding data is deleted instead. Thus, by removing signals indicating abnormal height at edge portions of a cylindrical spacer and measuring the height of portions other than the edge portions, the height of the cylindrical spacer can be measured with accuracy. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011220712(A) 申请公布日期 2011.11.04
申请号 JP20100086896 申请日期 2010.04.05
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 HORINOUCHI TAKETO;KURODA MASAHIRO
分类号 G01B11/02 主分类号 G01B11/02
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