发明名称 SPECTROSCOPIC ANALYZER FOR MICROSCOPE
摘要 <P>PROBLEM TO BE SOLVED: To achieve a spectroscopic analyzer for a microscope enabling spectroscopy at a high speed with a wavelength resolution at a predetermined interval. <P>SOLUTION: When excitation light is irradiated from a light source to a sample, the spectroscopic analyzer for the microscope analyzes many scattered lights emitted by the sample, which are made incident on the microscope and cover a wide wavelength range. The spectroscopic analyzer includes: a first optical means by which the scattered lights are converted into a parallel luminous flux; a first variable band-pass filter means having a variable transmission wavelength band to transmit the incident light therethrough, through which the predetermined light of the transmission wavelength band out of the incident scattered lights converted into the parallel luminous flux is transmitted; a two-dimensional array light detection means by which the scattered lights in the transmission wavelength band are imaged; and a control means by which timing of imaging of the two-dimensional array light detection means is controlled and according to this timing, the transmission wavelength band of the first variable hand-pass filter means is changed. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011220700(A) 申请公布日期 2011.11.04
申请号 JP20100086696 申请日期 2010.04.05
申请人 YOKOGAWA ELECTRIC CORP 发明人 IGA MITSUHIRO
分类号 G01J3/26;G01J3/44;G01N21/65 主分类号 G01J3/26
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