发明名称 METHOD FOR MANUFACTURING SIC SEMICONDUCTOR ELEMENT
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a SiC semiconductor element which corrects the warpage of a SiC substrate caused by thinning process. <P>SOLUTION: The method for manufacturing the semiconductor element includes the steps of: (a) preparing a SiC substrate 1 provided with an element active region on a front surface; (b) fixing the front surface of the SiC substrate 1 on a flat surface and grinding the rear surface; and (c) forming inner stress layers, which give stress to cancel the warpage of the SiC substrate caused by grinding, within the SiC substrate, while the front surface of the SiC substrate 1 is fixed to the flat surface. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011222607(A) 申请公布日期 2011.11.04
申请号 JP20100087522 申请日期 2010.04.06
申请人 MITSUBISHI ELECTRIC CORP 发明人 SAWADA TAKAO
分类号 H01L29/47;H01L29/872 主分类号 H01L29/47
代理机构 代理人
主权项
地址
您可能感兴趣的专利