发明名称 SELF-TEST BUILT-IN SDRAM CONTROLLER
摘要 <P>PROBLEM TO BE SOLVED: To provide a self-test built-in SDRAM controller for safely performing verify check by making a memory controller itself have the function of verify check. <P>SOLUTION: This self-test built-in SDRAM controller is provided with: an SDRAM control module 13 for controlling the writing/reading operation of an SDRAM 12; a BIT control state machine 16 for generating a test signal, and for writing the test signal via the SDRAM control module 13 in the SDRAM 12, and for reading the signal written in the SDRAM 12 to perform verify check to detect whether the signal is matched with the above mentioned test signal; and a BIT data generation module configured of a selector for selecting the writing and reading of an external signal from an external line for the SDRAM 12 or the writing and reading of the above mentioned test signal for the SDRAM 12. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011221820(A) 申请公布日期 2011.11.04
申请号 JP20100090920 申请日期 2010.04.09
申请人 TOSHIBA DENPA PRODUCTS KK 发明人 KONNO SATOSHI
分类号 G06F12/16 主分类号 G06F12/16
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