BUILT OFF SELF TEST CIRCUIT DEVICE OR PATTERN-GENERATING DEVICE HAVING A LOOK-UP TABLE EMBEDDED THEREIN, AND METHOD FOR OUTPUTTING TEST DATA FOR A DEVICE UNDER TEST USING SAME

摘要

The present invention relates to a built off self test (BOST) circuit device or pattern-generating device having a look-up table embedded therein, which take an input from automatic test equipment (ATE), and output test data for a device under test (DUT). The device of the present invention has a look-up table embedded in a built off self test (BOST) circuit to extend and transform an input pattern program value into an output table value, and to transmit the output table value to the device under test (DUT), thereby effectively overcoming the deficiencies of control bits in an inexpensive manner.