| 摘要 |
<p>Disclosed is an inspection method for organic EL display devices in which pixel defects do not escape even if a light emitting state based on the application of a reverse bias changes with time. The inspection method for organic EL devices equipped with a plurality of light emitting pixels involves a first step for imaging the light emitting pixels for a prescribed period of time in a state in which a reverse bias voltage is applied to the plurality of light emitting pixels, a second step for specifying the light emission point at which emitted light has leaked in the first step to a threshold intensity or higher, and a third step that, in cases in which, after repeating the first step and the second step multiple times, the same light emission point has been specified at least twice within the multiple executions of the second step, assesses the light emitting pixel comprising said light emission point as a defective pixel.</p> |
