发明名称 INVALID WRITE PREVENTION FOR STT-MRAM ARRAY
摘要 <p>In a Spin Transfer Torque Magnetoresi stive Random Access Memory (STT-MRAM) a bit cell array can have a source line substantially parallel to a word line. The source line can be substantially perpendicular to bit lines. A source line control unit includes a common source line driver and a source line selector configured to select individual ones of the source lines. The source line driver and source line selector can be coupled in multiplexed relation. A bit line control unit includes a common bit line driver and a bit line selector in multiplexed relation. The bit line control unit includes a positive channel metal oxide semiconductor (PMOS) element coupled between the common source line driver and bit line select lines and bit lines. Write disturb is prevented by setting a voltage associated with unselected ones of the bit lines equal to a selected source line.</p>
申请公布号 WO2011136965(A1) 申请公布日期 2011.11.03
申请号 WO2011US32900 申请日期 2011.04.18
申请人 QUALCOMM INCORPORATED;RYU, KYUNGHO;KIM, JISU;JUNG, SEONG-OOK;KANG, SEUNG H. 发明人 RYU, KYUNGHO;KIM, JISU;JUNG, SEONG-OOK;KANG, SEUNG H.
分类号 G11C11/16 主分类号 G11C11/16
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