发明名称 Charged particle multi-beamlet lithography system, modulation device , and method of manufacturing thereof
摘要 The invention relates to a modulation device for use in a charged particle multi-beamlet lithography system. The device includes a body comprising an interconnect structure provided with a plurality of modulators and interconnects at different levels within the interconnect structure for enabling connection of the modulators to one or more pattern data receiving elements. A modulator includes a first electrode, a second electrode, and an aperture extending through the body. The electrodes are located on opposing sides of the aperture for generating an electric field across the aperture. At least one of the first electrode and the second electrode includes a first conductive element formed at a first level of the interconnect structure and a second conductive element formed at a second level of the interconnect structure. The first and second conductive elements are electrically connected with each other.
申请公布号 US2011266418(A1) 申请公布日期 2011.11.03
申请号 US20100911861 申请日期 2010.10.26
申请人 MAPPER LITHOGRAPHY IP B.V. 发明人 WIELAND MARCO JAN-JACO;POSTMA FERRY MICHAEL
分类号 H01J3/26;G01J3/26;H01L31/18 主分类号 H01J3/26
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