发明名称 PROCESS FOR PRODUCING REFLECTIVE MASK BLANK FOR EUV LITHOGRAPHY
摘要 Provision of a process for producing an EUV mask blank wherein formation of scars of a glass substrate surface or a chuck surface due to sandwiching of foreign objects such as particles between an electrostatic chuck and the glass substrate, is suppressed. A process for producing an EUV mask blank wherein an electrostatic chuck for clamping a glass substrate has a main body and a lower dielectric layer made of an organic polymer film, and electrode portion made of an electrically conductive material and an upper dielectric layer made of an organic polymer film provided in this order on the main body, wherein the upper dielectric layer includes an anode and a cathode.
申请公布号 US2011266140(A1) 申请公布日期 2011.11.03
申请号 US201113180611 申请日期 2011.07.12
申请人 ASAHI GLASS COMPANY LIMITED 发明人 KINOSHITA TAKERU;ISE HIROTOSHI
分类号 C23C14/06;C23C14/34;G03F1/24 主分类号 C23C14/06
代理机构 代理人
主权项
地址