发明名称 COMPOSITION FOR THE BOTTOM LAYER OF A RESIST, AND METHOD USING SAME TO MANUFACTURE A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 Provided is a composition for the bottom layer of a resist, including an organic-silane-based polycondensation compound and a solvent, wherein the organic-silane-based polycondensation compound contains from 40 to 80 mol % of a structural unit as expressed in chemical formula 1. Therefore, the present invention relates to a composition for the bottom layer of a resist enabling excellent pattern transferability, using a bottom layer of a resist having excellent storage stability and etch resistance, and to a method using same to manufacture a semiconductor integrated circuit device.
申请公布号 WO2011081321(A3) 申请公布日期 2011.11.03
申请号 WO2010KR08849 申请日期 2010.12.10
申请人 CHEIL INDUSTRIES INC.;KIM, MI-YOUNG;KIM, SANG-KYUN;CHO, HYEON-MO;KOH, SANG-RAN;YUN, HUI-CHAN;CHUNG, YONG-JIN;KIM, JONG-SEOB 发明人 KIM, MI-YOUNG;KIM, SANG-KYUN;CHO, HYEON-MO;KOH, SANG-RAN;YUN, HUI-CHAN;CHUNG, YONG-JIN;KIM, JONG-SEOB
分类号 G03F7/11;G03F7/075;H01L21/027 主分类号 G03F7/11
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