发明名称 SELECTIVE FABRICATION OF HIGH-CAPACITANCE INSULATOR FOR A METAL-OXIDE-METAL CAPACITOR
摘要 <p>Methods and devices of a capacitor in a semiconductor device having an increased capacitance are disclosed. In a particular embodiment, a method of forming a capacitor is disclosed. A section of a first insulating material between a first metal contact element and a second metal contact element is removed to form a channel. A second insulating material is deposited in the channel between the first metal contact element and the second metal contact element.</p>
申请公布号 KR20110120363(A) 申请公布日期 2011.11.03
申请号 KR20117024261 申请日期 2010.03.16
申请人 QUALCOMM INCORPORATED 发明人 KANG WOO TAG;KIM, JONG HAE;SUH, JUNG WON
分类号 H01L27/108;H01L21/8242;H01L27/04 主分类号 H01L27/108
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