发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to improve the properties of a semiconductor device by preventing not-open and SAC(Self-Aligned Contact) defects. CONSTITUTION: A conductive pattern(150) is formed on a semiconductor substrate(100). A contact hole is formed between conductive patterns. The control hole is processed with plasma. A spacer(140) is formed on the conductive pattern sidewall. An interlayer dielectric layer(160) is formed on the surface including the conductive pattern. A contact plug is formed between the conductive patterns.
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申请公布号 |
KR20110119048(A) |
申请公布日期 |
2011.11.02 |
申请号 |
KR20100038523 |
申请日期 |
2010.04.26 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
PARK, CHEOL HWAN;CHO, HO JIN;LEE, DONG KYUN |
分类号 |
H01L21/28;H01L21/336 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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