发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to improve the properties of a semiconductor device by preventing not-open and SAC(Self-Aligned Contact) defects. CONSTITUTION: A conductive pattern(150) is formed on a semiconductor substrate(100). A contact hole is formed between conductive patterns. The control hole is processed with plasma. A spacer(140) is formed on the conductive pattern sidewall. An interlayer dielectric layer(160) is formed on the surface including the conductive pattern. A contact plug is formed between the conductive patterns.
申请公布号 KR20110119048(A) 申请公布日期 2011.11.02
申请号 KR20100038523 申请日期 2010.04.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK, CHEOL HWAN;CHO, HO JIN;LEE, DONG KYUN
分类号 H01L21/28;H01L21/336 主分类号 H01L21/28
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